Mostly cosmetic changes from review of last PR. Also same inappropriate use of _info changes to configurable debug macros. Remember folks, if it has a _ or __ in front, it is not intended for use outside of the header file. It is an internal private definition.
This commit is contained in:
Gregory Nutt
parent
dcb5903592
commit
4cba634a12
5 changed files with 29 additions and 22 deletions
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@ -89,7 +89,7 @@ void stm32l4_spiinitialize(void)
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stm32l4_configgpio(GPIO_SPI_CS_SD_CARD);
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#endif
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_info("SPI1 initialized\n");
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spiinfo("SPI1 initialized\n");
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#endif
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#ifdef CONFIG_STM32L4_SPI2
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@ -99,7 +99,7 @@ void stm32l4_spiinitialize(void)
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/* Setup CS, EN & IRQ line IOs */
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_info("SPI2 initialized\n");
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spiinfo("SPI2 initialized\n");
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#endif
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}
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@ -219,7 +219,6 @@
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#define ADC1_MEASURE_CHANNEL 9
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#define GPIO_MEASURE_ADC (GPIO_ADC1_IN9)
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/* Quadrature encoder
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* Default is to use timer 5 (32-bit) and encoder on PA0/PA1
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*/
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@ -61,6 +61,7 @@
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/* STM32 chip specific calibration values *******************************************/
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/* Voltage used for calibration of internal analog reference voltage (Vrefint) */
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#if defined(CONFIG_ARCH_CHIP_STM32F7) \
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|| defined(CONFIG_ARCH_CHIP_STM32F4) \
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|| defined(CONFIG_ARCH_CHIP_STM32F0)
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@ -78,6 +79,7 @@
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* should nevertheless be verified from data-sheet when porting this
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* file to a new chip.
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*/
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#if defined(CONFIG_ARCH_CHIP_STM32F7)
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# define STM32_VREFINT_CAL (*(uint16_t *)((uint32_t)0x1ff0f44a))
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#elif defined(CONFIG_ARCH_CHIP_STM32F4)
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@ -93,9 +95,11 @@
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/* Internal temperature sensor calibration locations. Taken from
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* STM32L452 datasheet.
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*/
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#if defined(CONFIG_ARCH_CHIP_STM32L4)
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/* TS ADC raw data acquired at a temperature of 30 °C (± 5 °C) */
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# define STM32_TSENSE_TSCAL1 (*(int16_t *)((uint32_t)0x1fff75a8))
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/* TS ADC raw data acquired at a temperature of 130 °C (± 5 °C) */
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@ -167,7 +171,7 @@ int stm32l4_adc_measure_voltages(uint32_t *vrefint, uint32_t *vbat, uint32_t *ve
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fd = open("/dev/adc0", O_RDONLY);
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if (fd < 0)
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{
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_err("Cannot open ADC converter\n");
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aerr("ERROR: Cannot open ADC converter\n");
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ret = fd;
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goto out;
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}
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@ -175,7 +179,7 @@ int stm32l4_adc_measure_voltages(uint32_t *vrefint, uint32_t *vbat, uint32_t *ve
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ret = ioctl(fd, ANIOC_TRIGGER, 0);
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if (ret < 0)
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{
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_err("Cannot trigger ADC conversion\n");
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aerr("ERROR: Cannot trigger ADC conversion\n");
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goto out_close;
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}
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@ -186,16 +190,16 @@ int stm32l4_adc_measure_voltages(uint32_t *vrefint, uint32_t *vbat, uint32_t *ve
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ret = -errval;
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if (errval != EINTR)
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{
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_err("read failed: %d\n", errval);
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aerr("ERROR: read failed: %d\n", errval);
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goto out_close;
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}
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_info("Interrupted read...\n");
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ainfo("Interrupted read...\n");
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goto out_close;
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}
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else if (nbytes == 0)
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{
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_err("No data read\n");
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aerr("ERROR: No data read\n");
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ret = ERROR;
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goto out_close;
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}
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@ -203,20 +207,20 @@ int stm32l4_adc_measure_voltages(uint32_t *vrefint, uint32_t *vbat, uint32_t *ve
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nsamples = nbytes / sizeof(struct adc_msg_s);
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if (nsamples * sizeof(struct adc_msg_s) != nbytes)
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{
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_info("Read size=%ld is not a multiple of sample size=%d, Ignoring\n",
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ainfo("Read size=%ld is not a multiple of sample size=%d, Ignoring\n",
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(long)nbytes, sizeof(struct adc_msg_s));
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}
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else
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{
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int i;
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int32_t tsense;
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_info("Sample (nsamples = %d):\n", nsamples);
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ainfo("Sample (nsamples = %d):\n", nsamples);
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*vrefint = *vbat = *vext = 0;
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for (i = 0; i < nsamples ; i++)
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{
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_info("%d: channel: %d value: %d\n",
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ainfo("%d: channel: %d value: %d\n",
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i+1, sample[i].am_channel, sample[i].am_data);
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/* Add the raw value to entropy pool. */
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@ -229,8 +233,9 @@ int stm32l4_adc_measure_voltages(uint32_t *vrefint, uint32_t *vbat, uint32_t *ve
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/* Calculate corrected Vrefint with factory calibration value. */
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*vrefint = STM32_VREFINT_MVOLTS * STM32_VREFINT_CAL / sample[i].am_data;
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_info("VREFINT: %d -> %u mV\n", sample[i].am_data, *vrefint);
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ainfo("VREFINT: %d -> %u mV\n", sample[i].am_data, *vrefint);
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break;
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case ADC1_INTERNAL_TSENSE_CHANNEL:
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/* Calculate final temperature. Sensor precision is ±2 °C,
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* so it does not matter much if we use integer type here.
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@ -238,18 +243,21 @@ int stm32l4_adc_measure_voltages(uint32_t *vrefint, uint32_t *vbat, uint32_t *ve
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tsense = (110 - 30) * (sample[i].am_data - STM32_TSENSE_TSCAL1)
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/ (STM32_TSENSE_TSCAL2 - STM32_TSENSE_TSCAL1) + 30;
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_info("TSENSE: %d -> %d °C\n", sample[i].am_data, tsense);
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ainfo("TSENSE: %d -> %d °C\n", sample[i].am_data, tsense);
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break;
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case ADC1_INTERNAL_VBATDIV3_CHANNEL:
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*vbat = 3 * sample[i].am_data;
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_info("VBAT/3: %d -> %u mV\n", sample[i].am_data, *vbat);
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ainfo("VBAT/3: %d -> %u mV\n", sample[i].am_data, *vbat);
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break;
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case ADC1_MEASURE_CHANNEL:
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*vext = sample[i].am_data;
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_info("External channel: %d\n", *vext);
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ainfo("External channel: %d\n", *vext);
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break;
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default:
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_err("ADC got value from unknown channel %d\n", sample[i].am_channel);
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aerr("ERROR: ADC got value from unknown channel %d\n", sample[i].am_channel);
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break;
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}
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}
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@ -289,7 +297,7 @@ int stm32l4_adc_setup(void)
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g_adc = stm32l4_adc_initialize(1, g_chanlist, ADC1_NCHANNELS);
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if (g_adc == NULL)
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{
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_err("Failed to get ADC interface\n");
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aerr("ERROR: Failed to get ADC interface\n");
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return -ENODEV;
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}
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@ -298,7 +306,7 @@ int stm32l4_adc_setup(void)
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ret = adc_register("/dev/adc0", g_adc);
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if (ret < 0)
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{
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_err("adc_register failed: %d\n", ret);
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aerr("ERROR: adc_register failed: %d\n", ret);
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return ret;
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}
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#endif
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@ -113,13 +113,13 @@ int stm32_bringup(void)
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#endif
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#ifdef CONFIG_DAC
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_info("Initializing DAC\n");
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ainfo("Initializing DAC\n");
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(void)stm32l4_dac_setup();
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#endif
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#ifdef CONFIG_ADC
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_info("Initializing ADC\n");
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ainfo("Initializing ADC\n");
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(void)stm32l4_adc_setup();
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#endif
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@ -74,7 +74,7 @@ int stm32l4_dac_setup(void)
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g_dac = stm32l4_dacinitialize(0);
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if (g_dac == NULL)
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{
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_err("Failed to get DAC interface\n");
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aerr("ERROR: Failed to get DAC interface\n");
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return -ENODEV;
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}
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@ -83,7 +83,7 @@ int stm32l4_dac_setup(void)
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ret = dac_register("/dev/dac0", g_dac);
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if (ret < 0)
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{
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_err("dac_register failed: %d\n", ret);
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aerr("ERROR: dac_register failed: %d\n", ret);
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return ret;
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}
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#endif
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